HVsys Testing UG (haftungsbeschränkt)

Space applications require compact, efficient, and long-term reliable power electronics capable of withstanding extreme operating conditions. Silicon carbide (SiC) and gallium nitride (GaN) power semiconductors are key technologies for these demanding environments, operating at increasingly higher voltages and switching frequencies. Ensuring reliable energy conversion under such conditions over long lifecycles requires a deep understanding of the dielectric aging and failure behavior of insulation systems under high-voltage and high-frequency stress. HVsys Testing addresses this challenge by developing automated long-term testing methods and services to analyze the dielectric aging and degradation behavior of insulation systems under HV/HF stress for next-generation SiC and GaN power semiconductor technologies. Semiconductor manufacturers can submit test samples, which are exposed to long-term dielectrical HV/HF stress until failure. The resulting insights provide valuable data to understand and control the underlying degradation mechanisms in insulation materials. This is particularly important in reliability-critical fields such as space applications, where extreme environmental conditions and high failure costs demand the utmost reliability and durability of power electronics. By advancing the understanding of HV/HF degradation mechanisms in insulation systems, HVsys Testing supports the development of more efficient, durable, and resilient power electronics for space environments.